Rotatable Scanning Probe Microscopy Head

Technologies

Licensing

CRADA

Facilities

Rotatable Scanning Probe Microscopy Head

PDF Version

Device consolidates several scanning probe tips into rotating array

The U.S. Navy seeks to commercialize, through licensing and collaborative commercial partnerships, U.S. Patent 7,597,717 (Rotatable multi-cantilever scanning probe microscopy head).

Background

Scanning Probe Microscopy (SPM) is a branch of the field of Microscopy, which is the use of microscopes to view samples or objects. SPM involves the interaction of a scanning probe with the surface or object of interest. SPM, in general, is a term used to describe a growing number of techniques that use a sharp probe to measure surfaces.

The growing field of Scanning Probe Microscopy has benefitted various fields of research that operate on a scale from microns down to nanometers. SPM has played a part in advancements in industries such as solar, data storage, integrated circuits, chemistry, and in many medical areas of study like DNA, cell membranes and bacteria.

The Technology

There are over 20 established types of scanning probe microscopes. Currently, each microscope requires a separate circuitry box to complete each specialized measurement (Capacitance, Magnetic, Spreading Resistance, Temperature, etc.), which can cost between $30-$50K each. SSC Pacific has developed a technology that consolidates many circuit boxes onto one array that rotates to apply each measurement. Instead of removing a circuit box on the machine and replacing it with another, the user would rotate the scanning probe head and apply the next measurement to the sample. This technology could allow the user to obtain more information about one sample by allowing many different tips to interact with the same measurement site. The system could also save money and materials during production by consolidating circuitry onto one machine.

Key Benefits

Capability to obtain more information about the sample area under study due to the integration of different types of specialized measurements

Ability to change circuit box quickly and with minimal disruption to sample

Lower cost to produce by consolidating circuitry onto one machine

Decreased cost of materials by avoiding duplication of parts

Development Status

U.S. Patent issued: 7,597,717

Total R&D: $500K and 2 years

DoD5000 Series Technical Readiness Level 2: Technology concept and/or application formulated

Potential to reach high Technical Readiness Level within an estimated 6 months

For more information on technology transfer, please contact us at (619) 553–2778 or email ssc_pac_t2@navy.mil
SD 867, October 2009. SSC Pacific, San Diego, CA 92152–5001. Approved for public release; distribution is unlimited.

Quick Links

No Fear Act | Work Status | Accessibility

FOIA | Fraud, Waste, & Abuse | Security & Privacy

USA.gov | This is an official United State Navy Website.

Contact Webmaster

This US Government system is subject to monitoring. Please review the Privacy Policy.

The appearance of external hyperlinks does not constitute endorsement by the United States Department of Defense, the United States Department of the Navy and the Space and Naval Warfare Systems Command (SPAWAR) of the linked web sites, or the information, products or services contained therein. For other than authorized activities such as military exchanges and Morale, Welfare and Recreation (MWR) sites, the United States Department of Defense, the Department of the Navy and the Space and Naval Warfare Systems Command does not exercise any editorial control over the information you may find at these locations. Such links are provided consistent with the stated purpose of this DoD web site.

In order to provide our customers with the best information more effectively, the SPAWAR Enterprise Public Website has undergone several recent revisions. We welcome your comments regarding revisions or other issues. Click Here to submit feedback.

Updated: 10/17/2011 3:35 PM EST Published (13.0)